Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou. Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs. Microelectronics Reliability, 74:74-80, 2017. [doi]
Abstract is missing.