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On Covering Structural Defects in NoCs by Functional Tests

Atefe Dalirsani, Nadereh Hatami, Michael E. Imhof, Marcus Eggenberger, Gert Schley, Martin Radetzki, Hans-Joachim Wunderlich. On Covering Structural Defects in NoCs by Functional Tests. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 87-92, IEEE Computer Society, 2014. [doi]

Authors

Atefe Dalirsani

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Nadereh Hatami

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Michael E. Imhof

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Marcus Eggenberger

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Gert Schley

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Martin Radetzki

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Hans-Joachim Wunderlich

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