Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò. Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 486-495, IEEE Computer Society, 1992.
@inproceedings{DalpassoFOR92,
title = {Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs},
author = {Marcello Dalpasso and Michele Favalli and Piero Olivo and Bruno Riccò},
year = {1992},
tags = {rule-based},
researchr = {https://researchr.org/publication/DalpassoFOR92},
cites = {0},
citedby = {0},
pages = {486-495},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}