Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò. Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 486-495, IEEE Computer Society, 1992.
Abstract is missing.