Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, S. Krause, Andreas Graff, Michél Simon-Najasek. Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-7, IEEE, 2021. [doi]
@inproceedings{DammannBKKBKGS21, title = {Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress}, author = {Maximilian Dammann and Martina Baeumler and Tobias Kemmer and Helmer Konstanzer and Peter Brückner and S. Krause and Andreas Graff and Michél Simon-Najasek}, year = {2021}, doi = {10.1109/IRPS46558.2021.9405227}, url = {https://doi.org/10.1109/IRPS46558.2021.9405227}, researchr = {https://researchr.org/publication/DammannBKKBKGS21}, cites = {0}, citedby = {0}, pages = {1-7}, booktitle = {IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021}, publisher = {IEEE}, isbn = {978-1-7281-6893-7}, }