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Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications

M. Dammann, M. Baeumler, Vladimir Polyakov, P. Brückner, H. Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek. Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectronics Reliability, 76:292-297, 2017. [doi]

Authors

M. Dammann

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M. Baeumler

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Vladimir Polyakov

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P. Brückner

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H. Konstanzer

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Rüdiger Quay

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Michael Mikulla

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Andreas Graff

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Michél Simon-Najasek

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