Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications

M. Dammann, M. Baeumler, Vladimir Polyakov, P. Brückner, H. Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek. Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectronics Reliability, 76:292-297, 2017. [doi]

Abstract

Abstract is missing.