M. Dammann, M. Baeumler, Vladimir Polyakov, P. Brückner, H. Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek. Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. Microelectronics Reliability, 76:292-297, 2017. [doi]
@article{DammannBPBKQMGS17,
title = {Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications},
author = {M. Dammann and M. Baeumler and Vladimir Polyakov and P. Brückner and H. Konstanzer and Rüdiger Quay and Michael Mikulla and Andreas Graff and Michél Simon-Najasek},
year = {2017},
doi = {10.1016/j.microrel.2017.07.008},
url = {https://doi.org/10.1016/j.microrel.2017.07.008},
researchr = {https://researchr.org/publication/DammannBPBKQMGS17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {292-297},
}