Seyed Danesh, William Holland, Joe Spalding, Michael Guidry, J. E. D. Hurwitz. An Energy Measurement Front-End with Integrated In-Situ Background Full System Accuracy Monitoring Including the Current and Voltage Sensors. In IEEE International Solid- State Circuits Conference, ISSCC 2019, San Francisco, CA, USA, February 17-21, 2019. pages 180-182, IEEE, 2019. [doi]
Abstract is missing.