rms Input Noise in 22 nm FinFET CMOS

Saeid Daneshgar, Hao Li 0047, Taehwan Kim, Ganesh Balamurugan. rms Input Noise in 22 nm FinFET CMOS. J. Solid-State Circuits, 57(5):1397-1408, 2022. [doi]

Abstract

Abstract is missing.