Khanh N. Dang, Akram Ben Ahmed, Abderazek Ben Abdallah, Xuan-Tu Tran. TSV-IaS: Analytic Analysis and Low-Cost Non-Preemptive on-Line Detection and Correction Method for TSV Defects. In 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019, Miami, FL, USA, July 15-17, 2019. pages 501-506, IEEE, 2019. [doi]
Abstract is missing.