RF Leakage in Embedded Devices: Security and Reliability Risks

Erez Danieli, Yoav Weizman, David Popovtzer, Itamar Levi. RF Leakage in Embedded Devices: Security and Reliability Risks. IEEE Design & Test of Computers, 43(1):58-71, February 2026. [doi]

Abstract

Abstract is missing.