The following publications are possibly variants of this publication:
- Negative bias temperature instability mechanisms in p-channel power VDMOSFETsNinoslav Stojadinovic, D. Dankovic, S. Djoric-Veljkovic, V. Davidovic, I. Manic, S. Golubovic. mr, 45(9-11):1343-1348, 2005. [doi]
- Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETsD. Dankovic, I. Manic, V. Davidovic, S. Djoric-Veljkovic, S. Golubovic, Ninoslav Stojadinovic. mr, 47(9-11):1400-1405, 2007. [doi]
- Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETsNinoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, S. Dimitrijev. mr, 41(9-10):1373-1378, 2001.