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D. Dankovic, I. Manic, V. Davidovic, S. Djoric-Veljkovic, S. Golubovic, Ninoslav Stojadinovic. Negative bias temperature instability in n-channel power VDMOSFETs. Microelectronics Reliability, 48(8-9):1313-1317, 2008. [doi]
Abstract is missing.