D. Dankovic - researchr alias

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Viewing Publication 1 - 8 from 8

2010

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stressNinoslav Stojadinovic, D. Dankovic, I. Manic, A. Prijic, V. Davidovic, S. Djoric-Veljkovic, S. Golubovic, Z. Prijic. mr, 50(9-11):1278-1282, 2010. [doi]

2009

Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETsI. Manic, D. Dankovic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic. mr, 49(9-11):1003-1007, 2009. [doi]

2008

Negative bias temperature instability in n-channel power VDMOSFETsD. Dankovic, I. Manic, V. Davidovic, S. Djoric-Veljkovic, S. Golubovic, Ninoslav Stojadinovic. mr, 48(8-9):1313-1317, 2008. [doi]

2007

Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETsD. Dankovic, I. Manic, V. Davidovic, S. Djoric-Veljkovic, S. Golubovic, Ninoslav Stojadinovic. mr, 47(9-11):1400-1405, 2007. [doi]

2006

NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETsD. Dankovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic. mr, 46(9-11):1828-1833, 2006. [doi]

2005

Effects of electrical stressing in power VDMOSFETsNinoslav Stojadinovic, I. Manic, V. Davidovic, D. Dankovic, S. Djoric-Veljkovic, S. Golubovic, S. Dimitrijev. mr, 45(1):115-122, 2005. [doi]

Negative bias temperature instability mechanisms in p-channel power VDMOSFETsNinoslav Stojadinovic, D. Dankovic, S. Djoric-Veljkovic, V. Davidovic, I. Manic, S. Golubovic. mr, 45(9-11):1343-1348, 2005. [doi]

2002

Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETsNinoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, D. Dankovic, S. Golubovic, S. Dimitrijev. mr, 42(9-11):1465-1468, 2002. [doi]

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