Depth perception using blurring and its application in VLSI wafer probing

R. V. Dantu, Nikitas J. Dimopoulos, R. V. Patel, A. J. Al-Khalili. Depth perception using blurring and its application in VLSI wafer probing. Mach. Vis. Appl., 5(1):35-45, 1991. [doi]

Abstract

Abstract is missing.