F. Darlay, B. Courtois. Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks. In Gordon Adshead, Jochen A. G. Jess, editors, European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990. pages 344-349, IEEE Computer Society, 1990. [doi]
Abstract is missing.