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Low-cost backside laser test method to pre-characterize the COTS IC s sensitivity to Single Event Effects

F. Darracq, Hervé Lapuyade, N. Buard, Pascal Fouillat, R. Dufayel, T. Carriere. Low-cost backside laser test method to pre-characterize the COTS IC s sensitivity to Single Event Effects. Microelectronics Reliability, 43(9-11):1615-1619, 2003. [doi]

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F. Darracq

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Hervé Lapuyade

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N. Buard

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Pascal Fouillat

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R. Dufayel

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T. Carriere

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