Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations

Bishnu Prasad Das, Janakiraman V. Bharadwaj Amrutur, H. S. Jamadagni, N. V. Arvind. Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations. In 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India. pages 685-691, IEEE Computer Society, 2008. [doi]

Abstract

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