Early Analysis of Critical Faults: An Approach to Test Generation From Formal Specifications

Sourasis Das, Ansuman Banerjee, Pallab Dasgupta. Early Analysis of Critical Faults: An Approach to Test Generation From Formal Specifications. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(3):447-451, 2012. [doi]

Authors

Sourasis Das

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Ansuman Banerjee

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Pallab Dasgupta

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