Sourasis Das, Ansuman Banerjee, Pallab Dasgupta. Early Analysis of Critical Faults: An Approach to Test Generation From Formal Specifications. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(3):447-451, 2012. [doi]
@article{DasBD12,
title = {Early Analysis of Critical Faults: An Approach to Test Generation From Formal Specifications},
author = {Sourasis Das and Ansuman Banerjee and Pallab Dasgupta},
year = {2012},
doi = {10.1109/TCAD.2011.2171183},
url = {http://dx.doi.org/10.1109/TCAD.2011.2171183},
researchr = {https://researchr.org/publication/DasBD12},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {31},
number = {3},
pages = {447-451},
}