27.3 EM and Power SCA-Resilient AES-256 in 65nm CMOS Through >350× Current-Domain Signature Attenuation

Debayan Das, Josef Danial, Anupam Golder, Nirmoy Modak, Shovan Maity, Baibhab Chatterjee, Dong-Hyun Seo, Muya Chang, Avinash Varna, Harish Krishnamurthy, Sanu Mathew, Santosh Ghosh, Arijit Raychowdhury, Shreyas Sen. 27.3 EM and Power SCA-Resilient AES-256 in 65nm CMOS Through >350× Current-Domain Signature Attenuation. In 2020 IEEE International Solid- State Circuits Conference, ISSCC 2020, San Francisco, CA, USA, February 16-20, 2020. pages 424-426, IEEE, 2020. [doi]

Authors

Debayan Das

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Josef Danial

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Anupam Golder

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Nirmoy Modak

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Shovan Maity

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Baibhab Chatterjee

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Dong-Hyun Seo

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Muya Chang

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Avinash Varna

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Harish Krishnamurthy

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Sanu Mathew

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Santosh Ghosh

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Arijit Raychowdhury

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Shreyas Sen

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