Debayan Das, Josef Danial, Anupam Golder, Nirmoy Modak, Shovan Maity, Baibhab Chatterjee, Dong-Hyun Seo, Muya Chang, Avinash Varna, Harish Krishnamurthy, Sanu Mathew, Santosh Ghosh, Arijit Raychowdhury, Shreyas Sen. 27.3 EM and Power SCA-Resilient AES-256 in 65nm CMOS Through >350× Current-Domain Signature Attenuation. In 2020 IEEE International Solid- State Circuits Conference, ISSCC 2020, San Francisco, CA, USA, February 16-20, 2020. pages 424-426, IEEE, 2020. [doi]
@inproceedings{DasDGMMCSCVKMGR20,
title = {27.3 EM and Power SCA-Resilient AES-256 in 65nm CMOS Through >350× Current-Domain Signature Attenuation},
author = {Debayan Das and Josef Danial and Anupam Golder and Nirmoy Modak and Shovan Maity and Baibhab Chatterjee and Dong-Hyun Seo and Muya Chang and Avinash Varna and Harish Krishnamurthy and Sanu Mathew and Santosh Ghosh and Arijit Raychowdhury and Shreyas Sen},
year = {2020},
doi = {10.1109/ISSCC19947.2020.9062997},
url = {https://doi.org/10.1109/ISSCC19947.2020.9062997},
researchr = {https://researchr.org/publication/DasDGMMCSCVKMGR20},
cites = {0},
citedby = {0},
pages = {424-426},
booktitle = {2020 IEEE International Solid- State Circuits Conference, ISSCC 2020, San Francisco, CA, USA, February 16-20, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3205-1},
}