Subrata Das, Debesh Kumar Das, Soumya Pandit. Reliability Aware Global Routing of Graphene Nanoribbon Based Interconnect. In Ambika Prasad Shah, Sudeb Dasgupta, Anand D. Darji, Jaynarayan T. Tudu, editors, VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers. Volume 1687 of Communications in Computer and Information Science, pages 373-386, Springer, 2022. [doi]
Abstract is missing.