A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI - researchr publication

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Sumit Dasgupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams. A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 63-66, IEEE Computer Society, 1982.

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