Debesh Kumar Das, Tomoo Inoue, Susanta Chakraborty, Hideo Fujiwara. Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 342-347, IEEE Computer Society, 2004. [doi]
Abstract is missing.