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Sunil R. Das, Wen-Ben Jone. On random testing for combinational circuits with a high measure of confidence. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 22(4):748-754, 1992. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On random testing of sequential digital logic with a high confidence measure (abstract)Sunil R. Das. acm 1986: 498 [doi] Realizing a High Measure of Confidence for Defect Level Analysis of Random TestingParesh Gondalia, Allan Gutjahr, Wen-Ben Jone. itc 1993: 478-487 Realizing a high measure of confidence for defect level analysis of random testing [VLSI]Wen-Ben Jone, Paresh Gondalia, Allan Gutjahr. tvlsi, 3(3):446-450, 1995. [doi]
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