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Temperature aware energy-reliability trade-offs for mapping of throughput-constrained applications on multimedia MPSoCs

Anup Das 0001, Akash Kumar, Bharadwaj Veeravalli. Temperature aware energy-reliability trade-offs for mapping of throughput-constrained applications on multimedia MPSoCs. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]

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Anup Das 0001

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Akash Kumar

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Bharadwaj Veeravalli

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