Anup Das 0001, Akash Kumar, Bharadwaj Veeravalli. Temperature aware energy-reliability trade-offs for mapping of throughput-constrained applications on multimedia MPSoCs. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.