High bandwidth multi-variable combined resonant and integral resonant controller for fast image scanning of atomic force microscope

Sajal K. Das, Hemanshu Roy Pota, Ian R. Petersen. High bandwidth multi-variable combined resonant and integral resonant controller for fast image scanning of atomic force microscope. In 2013 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Wollongong, Australia, July 9-12, 2013. pages 838-843, IEEE, 2013. [doi]

Authors

Sajal K. Das

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Hemanshu Roy Pota

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Ian R. Petersen

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