Sunil R. Das, Rochit Rajsuman. Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing - Future of Semiconductor Test. IEEE T. Instrumentation and Measurement, 54(5):1659-1661, 2005. [doi]
@article{DasR05-0,
title = {Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing - Future of Semiconductor Test},
author = {Sunil R. Das and Rochit Rajsuman},
year = {2005},
doi = {10.1109/TIM.2005.857481},
url = {http://dx.doi.org/10.1109/TIM.2005.857481},
tags = {testing},
researchr = {https://researchr.org/publication/DasR05-0},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {54},
number = {5},
pages = {1659-1661},
}