Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing - Future of Semiconductor Test - researchr publication

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Sunil R. Das, Rochit Rajsuman. Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing - Future of Semiconductor Test. IEEE T. Instrumentation and Measurement, 54(5):1659-1661, 2005. [doi]

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