Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing - Future of Semiconductor Test - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Sunil R. Das, Rochit Rajsuman. Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing - Future of Semiconductor Test. IEEE T. Instrumentation and Measurement, 55(2):378-380, 2006. [doi]

This author has not been identified. Look up 'Sunil R. Das' in GoogleThis author has not been identified. Look up 'Rochit Rajsuman' in Google

runs on WebDSL