Sunil R. Das, Rochit Rajsuman. Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing - Future of Semiconductor Test. IEEE T. Instrumentation and Measurement, 55(2):378-380, 2006. [doi]
@article{DasR06-0,
title = {Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing - Future of Semiconductor Test},
author = {Sunil R. Das and Rochit Rajsuman},
year = {2006},
doi = {10.1109/TIM.2006.873383},
url = {http://dx.doi.org/10.1109/TIM.2006.873383},
tags = {testing},
researchr = {https://researchr.org/publication/DasR06-0},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {55},
number = {2},
pages = {378-380},
}