Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets - researchr publication

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Sunil R. Das, M. Sudarma, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Krishnendu Chakrabarty, Mehmet Sahinoglu. Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets. IEEE T. Instrumentation and Measurement, 52(5):1363-1380, 2003. [doi]

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