The following publications are possibly variants of this publication:
- Syndrome Signature in Output Compaction for VLSI Built-in Self-TestSunil R. Das, Nita Goel, Wen-Ben Jone, Amiya R. Nayak. vlsi, 1998(2):191-201, 1998. [doi]
- Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterizationSunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu. tim, 54(5):1662-1677, 2005. [doi]
- An improved output compaction technique for built-in self-test in VLSI circuitsSunil R. Das, H. T. Ho, Wen-Ben Jone, A. R. Nayak. vlsid 1995: 403-407 [doi]