Koushik K. Das, Steven G. Walker, Manjul Bhushan. An Integrated CAD Methodology for Evaluating MOSFET and Parasitic Extraction Models and Variability. Proceedings of the IEEE, 95(3):670-687, 2007. [doi]
@article{DasWB07,
title = {An Integrated CAD Methodology for Evaluating MOSFET and Parasitic Extraction Models and Variability},
author = {Koushik K. Das and Steven G. Walker and Manjul Bhushan},
year = {2007},
doi = {10.1109/JPROC.2006.890091},
url = {https://doi.org/10.1109/JPROC.2006.890091},
researchr = {https://researchr.org/publication/DasWB07},
cites = {0},
citedby = {0},
journal = {Proceedings of the IEEE},
volume = {95},
number = {3},
pages = {670-687},
}