An Integrated CAD Methodology for Evaluating MOSFET and Parasitic Extraction Models and Variability

Koushik K. Das, Steven G. Walker, Manjul Bhushan. An Integrated CAD Methodology for Evaluating MOSFET and Parasitic Extraction Models and Variability. Proceedings of the IEEE, 95(3):670-687, 2007. [doi]

Abstract

Abstract is missing.