Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka. Performance-Optimized Design for Parametric Reliability. J. Electronic Testing, 24(1-3):129-141, 2008. [doi]
@article{DattaADCN08,
title = {Performance-Optimized Design for Parametric Reliability},
author = {Ramyanshu Datta and Jacob A. Abraham and Abdulkadir Utku Diril and Abhijit Chatterjee and Kevin J. Nowka},
year = {2008},
doi = {10.1007/s10836-007-5001-y},
url = {http://dx.doi.org/10.1007/s10836-007-5001-y},
tags = {optimization, reliability, design},
researchr = {https://researchr.org/publication/DattaADCN08},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {1-3},
pages = {129-141},
}