Basab Datta, Wayne Burleson. Analysis and mitigation of NBTI-impact on PVT variability in repeated global interconnect performance. In R. Iris Bahar, Fabrizio Lombardi, David Atienza, Erik Brunvand, editors, Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010. pages 341-346, ACM, 2010. [doi]
Abstract is missing.