Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Kaushik Roy. A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 170-175, IEEE Computer Society, 2005. [doi]
@inproceedings{DattaBMR05,
title = {A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations},
author = {Animesh Datta and Swarup Bhunia and Saibal Mukhopadhyay and Kaushik Roy},
year = {2005},
doi = {10.1109/ATS.2005.16},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.16},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/DattaBMR05},
cites = {0},
citedby = {0},
pages = {170-175},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}