Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Kaushik Roy. A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 170-175, IEEE Computer Society, 2005. [doi]
Abstract is missing.