Animesh Datta, Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy. Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 275-280, IEEE Computer Society, 2005. [doi]
Abstract is missing.