Rudrajit Datta, Nur A. Touba. Post-manufacturing ECC customization based on Orthogonal Latin Square codes and its application to ultra-low power caches. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 212-218, IEEE, 2010. [doi]
Abstract is missing.