Rene David, S. Rahal, J. L. Rainard. Some relationships between delay testing and stuck-open testing in CMOS circuits. In Gordon Adshead, Jochen A. G. Jess, editors, European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990. pages 339-343, IEEE Computer Society, 1990. [doi]
Abstract is missing.