The Effect of Periof Generation Techniques on Period Resolution and Waveform Jitter in VLSI Test Systems - researchr publication

researchr

You are not signed in
Sign in
Sign up

Michael G. Davis. The Effect of Periof Generation Techniques on Period Resolution and Waveform Jitter in VLSI Test Systems. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 685-690, IEEE Computer Society, 1996.

Abstract is missing.

runs on WebDSL