Multi-Purpose Digital Test Core Utilizing Programmable Logic

J. S. Davis, David C. Keezer. Multi-Purpose Digital Test Core Utilizing Programmable Logic. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 438-445, IEEE Computer Society, 2002. [doi]

Authors

J. S. Davis

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David C. Keezer

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