J. S. Davis, David C. Keezer. Multi-Purpose Digital Test Core Utilizing Programmable Logic. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 438-445, IEEE Computer Society, 2002. [doi]
@inproceedings{DavisK02,
title = {Multi-Purpose Digital Test Core Utilizing Programmable Logic},
author = {J. S. Davis and David C. Keezer},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430438abs.htm},
tags = {testing, C++, logic programming, logic},
researchr = {https://researchr.org/publication/DavisK02},
cites = {0},
citedby = {0},
pages = {438-445},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}