Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies

William Rhett Davis, Eun Chu Oh, Ambarish M. Sule, Paul D. Franzon. Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies. IEEE Trans. VLSI Syst., 17(4):496-506, 2009. [doi]

Authors

William Rhett Davis

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Eun Chu Oh

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Ambarish M. Sule

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Paul D. Franzon

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