Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies

William Rhett Davis, Eun Chu Oh, Ambarish M. Sule, Paul D. Franzon. Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies. IEEE Trans. VLSI Syst., 17(4):496-506, 2009. [doi]

Abstract

Abstract is missing.